X-eye SF160FSL

2D & 3D Micro CT System

• Non-destructive analysis of semiconductor, SMT, and electron/electric components

• Hybrid Tube Option (160kv/500㎛, 10,000hrs/filament)

• Dual CT – High-quality CT image / high speed scan

Best performance X-ray Inspection System
High-performance Micro-focus Open Tube with 160kV is installed and fine defects of 1㎛ are detectable.
High-resolution X-ray image can be gained with world best magnification by installing high-price Open Tube as standard.
Dual CT function can be purchased additionally, and exact location & size of defects can be detected and analyzed with this function.